上海納騰儀器有限公司
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GGB微波探針、多探針、探卡
型號(hào) 規(guī)格 Model 10 dc to 11 GHz Model 40A (dc to 40 GHz / 2.9mm K connector input) Now available with nickel alloy contacts for probing aluminum pads Dual / Differential Microwave Probe two microwave probes on one positioner - 40A, 50A, 67A, or 110H Model 40M ultra low loss - dc to 40 GHz Model 50A dc to 50 GHz / 2.4 mm connector input Model 67A dc to 67 GHz / 1.85 mm V connector input Model 110H dc to 110 GHz / 1.0 mm connector input Integrated Balun Probes Multi-Contact Wedge combines multiple RF and DC contacts - dc to 40, 50, 67 or 110 GHz Probe Cards surrounds a circuit with high-density RF and DC contacts - dc to 40, 50, 67 or 110 GHz Model 50 33 - 50 GHz / WR-22 waveguide input Model 75 50 to 75 GHz / WR-15 waveguide input Model 90 60 to 90 GHz / WR-12 waveguide input Model 120 75 to 110 GHz / WR-10 waveguide input Model 140 90 to 140 GHz / WR-8 waveguide input Model 170 110 to 170 GHz / WR-6 waveguide input Model 220 140 to 220 GHz / WR-5 waveguide input Model 325B 220 to 325 GHz / WR-3 waveguide input Model 500B 325 to 500 GHz / WR-2.2 waveguide input Model 1100B 750 to 1100 GHz / WR-1.0 waveguide input Calibration Substrates for probe tip calibration - available in 9 standard models Differential Calibration Substrates for two, three or four port probe tip calibrations
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